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Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

DONGGUAN LONROY EQUIPMENT CO LTD
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    Buy cheap Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device from wholesalers
     
    Buy cheap Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device from wholesalers
    • Buy cheap Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device from wholesalers

    Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

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    Brand Name : Lonroy
    Model Number : LR-A086
    Certification : CE ISO ASTM
    Price : Negotaible
    Payment Terms : L/C,D/A,D/P,T/T,Western Union,MoneyGram
    Supply Ability : 200
    Delivery Time : 5-8 work days
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    Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

    Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

    Description

    The surface topography measurement instrument is a measurement device specifically designed for the microscopic morphology analysis of high-precision parts, featuring high-precision measurement capabilities and excellent stability.

    In the field of precision manufacturing, the traditional measurement method of just one dimension is no longer sufficient to meet the stringent quality requirements of modern industries for parts. Although conventional size detection can reflect the geometric tolerances of parts, it is difficult to capture the key influence of the surface micro-topography on the performance of the parts.

    The topography measurement instrument breaks through the limitations of traditional measurement methods and is specifically designed for the microscopic morphology analysis of high-precision parts. It adopts advanced contact sensor technology to accurately measure surface features ranging from nanometers to micrometers.


    Technical Parameters

    Measuring Range

    X-axis

    120-220 mm

    X-axis Resolution

    1.2 nm

    Z-axis

    420 mm, 620 mm (optional)

    Profile Sensor

    Z1-axis Measuring Range

    30-60 mm

    Z1 Resolution

    1.2 nm

    Profile Accuracy

    Z1 Linear Accuracy

    ≤±(0.5 +|0.02H|) μm

    Circular Arc

    ±(1 + R/12) μm

    Circular Arc Pt

    ≤0.3 μm

    Angle

    ±1′

    Straightness

    0.3 μm/100 mm (cut-off wavelength 0.8)

    Driving Speed

    X-axis Driving Mode

    Electric

    Y-axis Driving Mode

    Electric

    Maximum Measuring Speed

    2 mm/s

    Marble Dimensions

    500 mm × 800 mm

    Countertop Material

    Natural marble


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